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@@ -17,7 +17,7 @@ TEM-LLM is a domain-specific multimodal large language model for
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  Transmission Electron Microscopy (TEM) image analysis, fine-tuned
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  from LLaVA-v1.5-7B using a difficulty-aware curriculum learning strategy.
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- This model is associated with the following work (currently under review):
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  > *AI-Assisted Materials Characterization: A Curriculum-Guided
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  > Multimodal Framework for Transmission Electron Microscopy*
@@ -87,6 +87,18 @@ refer to the [GitHub repository](https://github.com/SemiMIRTLab/TEM-LLM).
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  ---
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  ## Limitations
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  - TEM-LLM is optimized for TEM image analysis and may produce
 
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  Transmission Electron Microscopy (TEM) image analysis, fine-tuned
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  from LLaVA-v1.5-7B using a difficulty-aware curriculum learning strategy.
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+ This model is associated with the following work:
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  > *AI-Assisted Materials Characterization: A Curriculum-Guided
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  > Multimodal Framework for Transmission Electron Microscopy*
 
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  ---
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+ ## Citation
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+
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+ ```bibtex
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+ @article{citation-0,
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+ title={AI-Assisted Materials Characterization: A Curriculum-Guided Multimodal Framework for Transmission Electron Microscopy},
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+ author={Tu, Chong-ren and Hsueh, Hung-wei and Chang, Wei-che and Lin, You-ting and Cheng, Yu-hsuan and Chu, Wen-huei and Tseng, Shih-wen and Hsu, Shu-han},
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+ journal={ACS Measurement Science Au},
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+ publisher={ACS Publications}
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+ }
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+ ```
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+ ---
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+
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  ## Limitations
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  - TEM-LLM is optimized for TEM image analysis and may produce