research/technology_compatibility.csv

profile,present_method,material_interface,status,not_claimed,qualification
O,microscope/camera +force stage,transparent underside;local displacement and chemistry markers,preferred coarse laboratory route,stock camera resolution is not skin resolution,calibrate local branch laws and optical access
C,guarded capacitive flex interface,separate active/reference electrodes;sealed optional ionogel,custom development interface,no complete pinout or chip/array performance,"capacitance range,noise,leakage,parasitics,guarding and force calibration"
M,industrial Hall skin,nonmagnetic reversible macro overlay,macro evaluation only,not256independent fineforcepixels,"field perturbation,overlay thickness and full force recalibration"
Dense,microfabricated16x16 material units,"common platens,microstructured inserts,multiple measured outputs",scaling target,not a validatedmanufacturing yield or independentreadoutarray,"coarse validation first;then channel count,crosstalk,point-spread andyield"