RAPID: Risk of Attribute Prediction-Induced Disclosure in Synthetic Microdata
Abstract
RAPID is a disclosure risk metric that quantifies how well an adversary can infer sensitive attributes from synthetic microdata using predictive models trained solely on released data.
Statistical data anonymization increasingly relies on fully synthetic microdata, for which classical identity disclosure measures are less informative than an adversary's ability to infer sensitive attributes from released data. We introduce RAPID (Risk of Attribute Prediction--Induced Disclosure), a disclosure risk measure that directly quantifies inferential vulnerability under a realistic attack model. An adversary trains a predictive model solely on the released synthetic data and applies it to real individuals' quasi-identifiers. For continuous sensitive attributes, RAPID reports the proportion of records whose predicted values fall within a specified relative error tolerance. For categorical attributes, we propose a baseline-normalized confidence score that measures how much more confident the attacker is about the true class than would be expected from class prevalence alone, and we summarize risk as the fraction of records exceeding a policy-defined threshold. This construction yields an interpretable, bounded risk metric that is robust to class imbalance, independent of any specific synthesizer, and applicable with arbitrary learning algorithms. We illustrate threshold calibration, uncertainty quantification, and comparative evaluation of synthetic data generators using simulations and real data. Our results show that RAPID provides a practical, attacker-realistic upper bound on attribute-inference disclosure risk that complements existing utility diagnostics and disclosure control frameworks.
Get this paper in your agent:
hf papers read 2602.09235 Don't have the latest CLI?
curl -LsSf https://hf.co/cli/install.sh | bash Models citing this paper 0
No model linking this paper
Datasets citing this paper 1
Spaces citing this paper 0
No Space linking this paper
Collections including this paper 0
No Collection including this paper