hash stringlengths 32 32 | doc_id stringlengths 5 12 | section stringlengths 5 1.47k | content stringlengths 0 6.67M |
|---|---|---|---|
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.2 Conformance requirements | The occupied bandwidth shall be less than 1,6 MHz based on a chip rate of 1.28 Mcps. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.8: Parameters of the transmitted signal for occupied bandwidth test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i =... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.4.2 Procedure | 1) Measure the power of the transmitted signal with a measurement filter of bandwidth 30 kHz. The characteristic of the filter shall be approximately Gaussian (typical spectrum analyzer filter). The center frequency of the filter shall be stepped in contiguous 30 kHz steps from a minimum frequency, which shall be (2,4 ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measur... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2 Out of band emission | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1 Spectrum emission mask | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.1 Definition and applicability | For 1.28 Mcps chip rate TDD option, the spectrum emission mask specifies the limit of the transmitter out of band emissions at frequency offsets from the assigned channel frequency of the wanted signal between 0,8 MHz and 4,0 MHz. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.2 Conformance requirements | Emissions shall not exceed the maximum level specified in tables in Section 6.2.6.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.3 Test purpose | The test purpose is to verify that the BS out of band emissions do not result in undue interference to any other system (wideband, narrowband) operating at frequencies close to the assigned channel bandwidth of the wanted signal.
This test is independent of the characteristics of possible victim systems and, therefore,... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.9: Parameters of the transmitted signal for spectrum emission mask test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i;... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.4.2 Procedure | Measure the power of the BS spectrum emissions by applying measurement filters with bandwidths as specified in the relevant table in subclause 8.3.6.2.1.2. The characteristic of the filters shall be approximately Gaussian (typical spectrum analyzer filters). The center frequency of the filter shall be stepped in contig... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.5 Test requirements | The spectrum emissions measured according to subclause 8.3.6.2.1.4.2 shall be within the mask defined in the relevant table of subclause 8.3.6.2.1.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measur... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2 Adjacent Channel Leakage power Ratio (ACLR) | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.2 Conformance requirements | The ACLR shall be equal to or greater than the limits given in Tables in section 6.2.6.2.2 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.10: Parameters of the transmitted signal for ACLR test for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.4.2 Procedure | 1) Measure transmitted power over the 848 active chips of the time slots TS i=0,4,5,6 (this excludes the guard period), and with a measurement filter that has a RRC filter response with a roll off = 0,22 and a bandwidth equal to the chip rate. The power is determined by calculating the RMS value of the signal samples... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.5 Test requirements | The ACLR calculated in step (5) of subclause 8.3.6.2.2.4.2 shall be equal or greater than the limits given in table 6.5 in section 6.2.6.2.2. In case of operation in proximity to or co-siting with TDD BS or FDD BS operating on an adjacent frequency, the interference power calculated in (4) shall be equal or less than t... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.2.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement channel f... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3 Spurious emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.1 Definition and applicability | Spurious emissions are emissions which are caused by unwanted transmitter effects such as harmonics emission, parasitic emission, intermodulation products and frequency conversion products, but exclude out of band emissions. This is measured at the base station RF output port.
The requirements in this subclause shall a... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.2 Conformance requirements | The requirements of either subclause 6.2.6.3.1 or subclause 6.2.6.3.2 shall apply whatever the type of transmitter considered (single carrier or multi-carrier). It applies for all transmission modes foreseen by the manufacturer.
Either requirement applies at frequencies within the specified frequency ranges which are m... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.3 Test purpose | The test purpose is to verify the ability of the BS to limit the interference caused by unwanted transmitter effects to other systems operating at frequencies which are more than 4 MHz away from of the UTRA band used. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.11: Parameters of the transmitted signal for spurious emissions for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.4.2 Procedure | Measure the power of the spurious emissions by applying measurement filters with bandwidths as specified in the relevant tables of 8.3.6.3.2. The characteristic of the filters shall be approximately Gaussian (typical spectrum analyzer filters). The center frequency of the filter shall be stepped in contiguous steps ove... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.5 Test requirements | The spurious emissions measured according to subclause 8.3.6.3.4.2 shall not exceed the limits specified in the relevant tables of 8.3.6.3.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.3.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement c... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7 Transmit intermodulation | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.1 Definition and applicability | The transmit intermodulation performance is a measure of the capability of the transmitter to inhibit the generation of signals in its non linear elements caused by presence of the wanted signal and an interfering signal reaching the transmitter via the antenna.
The transmit intermodulation level is the power of the in... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.2 Conformance requirements | The transmit intermodulation level shall not exceed the out of band or the spurious emission requirements of subclause 8.3.6.2 and 8.3.6.3, respectively. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.3 Test purpose | The test purpose is to verify the ability of the BS transmitter to restrict the generation of intermodulation products in its non linear elements caused by presence of the wanted signal and an interfering signal reaching the transmitter via the antenna to below specified levels. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.12: Parameters of the transmitted signal for transmit intermodulation for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.4.2 Procedure | Apply the test procedures for out of band and spurious emissions as described in 8.3.6.2 and 8.3.6.3, respectively. The frequency band occupied by the interference signal are excluded from the measurements. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.5 Test requirements | The conformance requirements for out of band and spurious emissions as specified in 8.3.6.2 and 8.3.6.3 shall be met. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.7.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL refere... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8 Transmit Modulation | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1 Modulation accuracy | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.1 Definition and applicability | The modulation accuracy is a measure of the difference between the measured waveform and the theoretical modulated waveform (the error vector). A quantitative measure of the modulation accuracy is the error vector magnitude (EVM) which is defined as the square root of the ratio of the mean error vector power to the mea... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.13: Parameters of the transmitted signal for modulation accuracy for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0,... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.4.2 Procedure | Common with 3.84 Mcps Chip rate TDD option |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.1.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, so the number of timeslot i should be 0, 1,…,6. The structure of subframe is shown in section 7.2.1 of TR 25.928. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2 Peak code domain error | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.14: Parameters of the transmitted signal for Peak code domain error for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS i; i =... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.4.2 Procedure | Common with 3.84 Mcps Chip rate TDD option |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.8.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4 Receiver characteristics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.1 General | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2 Reference sensitivity level | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.2 Conformance requirements | For the measurement channel specified in Annex 8.A.2.1, the reference sensitivity level and performance of the BS shall be as specified in table section 6.3.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) Common with the 3.84 Mcps chip rate
3) Common with the 3.84 Mcps chip rate.
4) The level of BS tester output signal measured at the BS antenna connector shall be adjusted to -110 dBm. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.4.2 Procedure | Common with 3.84 Mcps chip rate TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.2.6 Explanation difference | There is no difference in the test method and test procedure between high chip rate TDD and low chip rate TDD, however the requirement is changed according to section 6.3.2.1 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3 Dynamic range | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.2 Conformance requirements | The BER shall not exceed 0,001 for the parameters specified in table in section 6.3.3 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) The level of the BS tester output signal measured at the BS antenna connector shall be adjusted as specified in table in subclause 8.4.3.2
3) The power spectral density of the band-limited white noise source measured at the BS antenna connector shall be adjusted as specified in... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.4.2 Procedure | Common with 3.84 Mcps chip rate TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.5 Test requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.3.6 Explanation difference | Due to the smaller bandwidth in low chip rate TDD the bandwidth of the white noise source is changed. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4 Adjacent Channel Selectivity (ACS) | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.2 Conformance requirements | The BER, measured on the wanted signal in the presence of an interfering signal, shall not exceed 0,001 for the parameters specified in table in section 6.3.4 of TR 25.945. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.4.1 Initial conditions | Common with the 3.84 Mcps chip rate
Common with the 3.84 Mcps chip rate
Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) defined in Annex C.3.The level of the UE simulator signal measured at the BS antenna connector shall be adjusted to the value specified in table ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.4.2 Procedure | 1) Set the center frequency of the interfering signal to 1,6 MHz above the assigned channel frequency of the wanted signal.
2) Measure the BER of the wanted signal at the BS receiver.
3) Set the center frequency of the interfering signal to 1,6 MHz below the assigned channel frequency of the wanted signal.
4) Measure t... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.5 Test requirements | The BER measured according subclause 8.4.4.4.2 to shall not exceed 0,001. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.4.6 Explanation difference | Because bandwidth of 1.28 Mcps TDD option is 1,6MHz, the frequency offset of the interfering singal should be 1,6MHz. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5 Blocking characteristics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.1 Definition and applicability | The blocking characteristics is a measure of the receiver ability to receive a wanted signal at its assigned channel frequency in the presence of an unwanted interferer on frequencies other than those of the adjacent channels. The blocking performance shall apply at all frequencies as specified in tables in section 6.3... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.2 Conformance requirements | The static reference performance as specified in the section 6.3.2 of TR 25.945 should be met with a wanted and an interfering signal coupled to the BS antenna input using the parameters specified in tables in section 6.3.5 of TR 25.945 respectively, using a 1 MHz step size.. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.3 Test purpose | The test stresses the ability of the BS receiver to withstand high-level interference from unwanted signals at frequency offsets of 3.2 MHz or more, without undue degradation of its sensitivity. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.4.1 Initial conditions | 1) Connect an UE simulator operating at the assigned channel frequency of the wanted signal and a signal generator to the antenna connector of one Rx port.
2) Terminate or disable any other Rx port not under test.
3) Start transmission from the BS tester to the BS using the UL reference measurement channel (12.2 kbps) ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.4.5.4.2 Procedure | 1) Set the signal generator to produce an interfering signal at a frequency offset Fuw from the assigned channel frequency of the wanted signal which is given by
Fuw = (n x 1 MHz),
where n shall be increased in integer steps from n = 10 up to such a value that the center frequency of the interfering signal covers the... |
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