hash stringlengths 32 32 | doc_id stringlengths 5 12 | section stringlengths 5 1.47k | content stringlengths 0 6.67M |
|---|---|---|---|
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.1.4.1.1 Background | The roll filter factor is would be 0.22, then we select the nominal bandwidth as 1.6MHz.
Considering the easy co-existence with Wide-band TDD mode, for its 3 times bandwidth would be 4.8, less than the nominal bandwidth of wide band UTRA TDD.
It is just nominal for 1.6MHz, and it is also flexible to adjust the channel ... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.1.4.1.2 Channel spacing | The channel spacing for 1.28 Mcps chip rate option is 1.6MHz. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.1.4.2 Channel raster | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.1.4.3 Channel number | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2 General test conditions and declarations | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.1 Base station classes | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.2 Output power and determination of power class | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.3 Specified frequency range | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.4 Spectrum emission mask | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.5 Adjacent Channel Leakage power Ratio (ACLR) | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.6 Tx spurious emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.6.1 Category of spurious emissions limit | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.6.2 Co-existence with GSM | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.6.3 Co-existence with DCS 1800 | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.6.4 Co-existence with UTRA FDD | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.7 Blocking characteristics | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.8 Test environments | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.9 Interpretation of measurement results | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.10 Selection of configurations for testing | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.11 BS Configurations | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.12 Overview of the conformance test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.2.13 Format and interpretation of tests | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3 Transmitter characteristics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.1 General | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2 Maximum output power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.4.1 Initial conditions | a) Common with the 3.84 Mcps chip rate
b) Common with the 3.84 Mcps chip rate
c) Common with the 3.84 Mcps chip rate
d) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.1: Parameters of the transmitted signal for maximum output power test for 1.2... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.4.2 Procedure | 1) Measure thermal power over the 848 active chips of a transmit time slot (this excludes the guard periods), and with a measurement bandwidth of at least 1.6 MHz.
2) Average over TBD time slots.
3) Run steps (1) and (2) for RF channels Low / Mid / High. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of the subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference me... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3 Frequency stability | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3.1 Definition and applicabilily | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3.2 Conformance requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) Common with the 3.84 Mcps chip rate
3) Common with the 3.84 Mcps chip rate
4) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.2: Parameters of the transmitted signal for Frequency stability test for 1.28... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3.4.2 Procedure | 1) Common with 3.84 Mcps chip rate TDD option.
2) Common with 3.84 Mcps chip rate TDD option.
3) Common with 3.84 Mcps chip rate TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.3.5 Test requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 9.3.3.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6.
The frequency stability is a characteristic of the local oscillato... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4 Output power dynamics | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.1 Inner loop power control | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2 Power control steps | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) Common with the 3.84 Mcps chip rate
3) For 1.28 Mcps chip rate TDD option, set the initial parameters of the transmitted signal according to the following table.
4) Common with the 3.84 Mcps chip rate
5) Common with the 3.84 Mcps chip rate
Table 8.3: Parameters of the transmitt... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.4.2 Procedure | 1) Common with 3.84 Mcps chip rate TDD option.
2) Set the BS tester to produce a sequence of TPC commands related to the active DPCH. This sequence shall be transmitted to the BS within the time slots TS i=1,2,3, and shall consist of a series of TPC commands with content "Increase Tx power", followed by a series of TPC... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the Structure of subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6.
For the 1.28 Mcps chip rate TDD option, each TS consists of 864 chips,... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3 Power control dynamic range | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the initial parameters of the transmitted signal according to the following table.
3) Common with the 3.84 Mcps chip rate
4) Common with the 3.84 Mcps chip rate
Table 8.4: Parameters of the transmitted signal for Power control dynamic ran... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.4.2 Procedure | 1) Common with 3.84 Mcps chip rate TDD option.
2) Set the BS tester to produce a sequence of TPC commands related to the active DPCH, with content "Increase Tx power". This sequence shall be sufficiently long so that the transmit output power of the active DPCH is controlled to reach its maximum, and shall be transmitt... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.3.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the structure of the subframe is shown in section7.2.1 of 3GPP TR 25.928), so the number of timeslot i should be 0, 1,…,6.
For the 1.28 Mcps chip rate TDD option, each TS consists of 864 ch... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4 Minimum transmit power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.2 Conformance requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
3) Common with the 3.84 Mcps chip rate
4) Common with the 3.84 Mcps chip rate
Table 8.5: Parameters of the transmitted signal for Minimum transmit power test for 1... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.4.2 Procedure | 1) Common with 3.84 Mcps chip rate TDD option.
2) Set the BS tester to produce a sequence of TPC commands related to all active DPCH, with content "Decrease Tx power". This sequence shall be sufficiently long so that the transmit output power of all active DPCH is controlled to reach its minimum, and shall be transmitt... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.5 Test requirements | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.4.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in Section 7.2.1 of TR 25.928.So the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measure... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5 Primary CCPCH power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.1 Definition and applicabilily | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.2 Conformance requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.4.1 Initial conditions | 1) Common with the 3.84 Mcps chip rate
2) For 1.28 Mcps chip rate TDD option, set the parameters of the transmitted signal according to the following table.
Table 8.6: Parameters of the BS transmitted signal for Primary CCPCH power testing for 1.28 Mcps chip rate TDD option
Parameter
Value/description
TDD Duty Cycle
TS... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.4.2 Procedure | 1) Measure the PCCPCH power in TS 0 by applying the global in-channel Tx test method described in Annex H.
2) Reduce the base station output power by 2 dB, 5 dB and 13 dB, without changing the relative powers of the PCCPCH, and repeat step (1) for each output power setting. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.5 Test requirement | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.4.5.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, the structure of subframe is shown in section 7.2.1 of TR 25.928. So the number of timeslot i should be 0, 1,…,6.
In 1.28 Mcps TDD option, likely scenario is that TS 0 is only used for broad... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5 Transmit ON/OFF power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1 Transmit OFF power | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.1 Definition and applicability | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.2 Conformance requirements | The transmit OFF power shall be less than –82 dBm measured with a filter that has a Root-Raised Cosine (RRC) filter response with a roll-off = 0,22 and a bandwidth equal to the chip rate. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.3 Test purpose | Common with 3.84 Mcps TDD option. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4.1 Initial conditions | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.4.1 for initial conditions. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.4.2 Procedure | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.4.2 for procedure. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.1.5 Test requirements | The conformance testing of transmit OFF power is included in the conformance testing of transmit ON/OFF time mask; therefore, see subclause 8.3.5.2.5 for test requirements. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2 Transmit ON/OFF time mask | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.1 Definition and applicability | Common with 3.84 Mcps TDD. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.2 Conformance requirements | The transmit power level versus time should meet the mask specified in figure 8.1.
Figure 8.1: Transmit ON/OFF template for 1.28 Mcps TDD
The reference for this requirement is subclause 6.2.5.2 of this Technique Report. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.3 Test purpose | Common with 3.84 Mcps TDD |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4 Method of test | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4.1 Initial conditions | 1) Connect the power measuring equipment to the BS antenna connector.
2) Set the parameters of the transmitted signal according to table 8.7.
Table 8.7: Parameters of the transmitted signal for transmit ON/OFF time mask test for 1.28 Mcps TDD
Parameter
Value/description
TDD Duty Cycle
TS i; i = 0, 1, 2, 3, 4, 5, 6:
tra... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.4.2 Procedure | Measure the power of the BS output signal chipwise (i.e. averaged over time intervals of one chip duration) over the transmit off power period starting 11 chips before the start of the receive time slot TS i = UpPCH, and ending 8 chips before the next transmit time slot TS i = 4 starts, and with a measurement filter th... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.5 Test requirements | Each value of the power measured according to subclause 8.3.5.2.4.2 shall be below the limits defined in figure 8.3.5.2.2.1 of subclause 8.3.5.2.2. |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.5.2.6 Explanation difference | For the 1.28 Mcps chip rate TDD option, one frame(10ms) consists of two subframes(5ms), and one subframe consists of 7 timeslots, (the subframe is shown in section7.2.1 of 3GPP TR 25.928, so the number of timeslot i should be 0, 1,…,6. In addition, for the 1.28 Mcps chip rate TDD option, the DL reference measurement ch... |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6 Output RF spectrum emissions | |
1cc4b09fd057c9a5cf925fb9b5a5f4e7 | 25.945 | 8.3.6.1 Occupied bandwidth |
Subsets and Splits
No community queries yet
The top public SQL queries from the community will appear here once available.